Open AccessThe design of technological devices for testing chips ADM232LAR
Author(s) -
O. E. Shustikov,
D. Iu. Kulagin,
M. A. Kulagina
Publication year - 2018
Publication title -
научный диалог: молодой ученый
Language(s) - English
Resource type - Conference proceedings
DOI - 10.18411/spc-22-10-2018-01
Subject(s) - computer science , reliability engineering , engineering