Open AccessInvestigation of methods for measuring parameters and characteristics of MOS transistors
Author(s) -
E. A. Volkov
Publication year - 2018
Publication title -
научные тенденции: вопросы точных и технических наук
Language(s) - English
Resource type - Conference proceedings
DOI - 10.18411/spc-12-06-2018-10
Subject(s) - transistor , computer science , materials science , optoelectronics , electronic engineering , electrical engineering , engineering , voltage