
Properties of Raman scattering in the CdS films, formed on the monocrystalline surface and porous silicon by the chemical bath deposition method
Author(s) -
В. В. Трегулов
Publication year - 2017
Publication title -
general question of world science
Language(s) - English
Resource type - Conference proceedings
DOI - 10.18411/gq-30-11-2017-02
Subject(s) - monocrystalline silicon , raman scattering , porous silicon , silicon , materials science , deposition (geology) , raman spectroscopy , porosity , scattering , porous medium , chemical engineering , nanotechnology , optoelectronics , optics , composite material , physics , paleontology , sediment , biology , engineering