
CONDUCTIVITY OF A THIN METAL LAYER TAKING INTO ACCOUNT THE DEPENDENCE OF THE SPECULARITY COEFFICIENT ON THE ANGLE OF THE ELECTRON’S INCIDENCE ON THE SURFACE
Author(s) -
Fakhriddin A. Karimov,
А. А. Yushkanov
Publication year - 2020
Publication title -
vestnik moskovskogo gosudarstvennogo oblastnogo universiteta. seriâ fizika-matematika
Language(s) - English
Resource type - Journals
eISSN - 2310-7251
pISSN - 2072-8387
DOI - 10.18384/2310-7251-2020-4-49-65
Subject(s) - specularity , layer (electronics) , materials science , incidence (geometry) , angle of incidence (optics) , surface (topology) , electron , metal , conductivity , electrical resistivity and conductivity , condensed matter physics , composite material , optics , physics , geometry , mathematics , metallurgy , quantum mechanics , specular reflection