Open AccessRESEARCH OF DEPENDENCES OF RELIABILITY INDICATORS OF APAR ON THE CORE TEMPERATURE OF A GAN CRYSTAL TRANSISTORS
Author(s) -
В. В. Костановський
Publication year - 2019
Publication title -
naukoêmnì tehnologìï/naukoêmni tehnologìï
Language(s) - English
Resource type - Journals
eISSN - 2310-5461
pISSN - 2075-0781
DOI - 10.18372/2310-5461.42.13759
Subject(s) - microwave , transistor , parabolic antenna , materials science , radar , exponential distribution , crystal (programming language) , reliability (semiconductor) , exponential function , computer science , electrical engineering , mathematics , physics , engineering , statistics , mathematical analysis , telecommunications , thermodynamics , power (physics) , voltage , programming language