Open AccessTHE METHOD OF IDENTIFYING THE PARAMETERS OF THE UNIVERSAL MODEL OF FAILURES APPROXIMATING THE GENERALIZED CURVE OF THE FAILURE RATE OF ELECTRONIC PRODUCTS
Author(s) -
В. В. Костановський,
О. Д. Козачук
Publication year - 2019
Publication title -
naukoêmnì tehnologìï/naukoêmni tehnologìï
Language(s) - English
Resource type - Journals
eISSN - 2310-5461
pISSN - 2075-0781
DOI - 10.18372/2310-5461.40.13273
Subject(s) - reliability engineering , reliability (semiconductor) , redundancy (engineering) , spare part , failure rate , process (computing) , computer science , exponential distribution , range (aeronautics) , electronic component , engineering , mathematics , statistics , mechanical engineering , power (physics) , physics , quantum mechanics , aerospace engineering , operating system