Open AccessNDT controls of evaluation reliability of products
Author(s) -
Sergiі Filonenko
Publication year - 1999
Publication title -
vìsnik nacìonalʹnogo avìacìĭnogo unìversitetu
Language(s) - English
Resource type - Journals
eISSN - 2306-1472
pISSN - 1813-1166
DOI - 10.18372/2306-1472.2.8965
Subject(s) - nondestructive testing , reliability (semiconductor) , reliability engineering , forensic engineering , engineering , physics , power (physics) , quantum mechanics