Open AccessExponential model deviations in reliability prediction of durable recoverable systems
Author(s) -
Victor Gribov,
Olena Kozhokhina,
Yu. V. Hryshchenko
Publication year - 2016
Publication title -
elektronìka ta sistemi upravlìnnâ
Language(s) - English
Resource type - Journals
ISSN - 1990-5548
DOI - 10.18372/1990-5548.48.11221
Subject(s) - reliability (semiconductor) , exponential function , reliability engineering , mathematics , statistics , computer science , engineering , thermodynamics , physics , mathematical analysis , power (physics)