Open AccessMetodología para el registro de parámetros de calidad de energía en microrredes Inteligentes
Author(s) -
Luis Eduardo Perdomo Orjuela,
Andrés Alfonso Rodríguez,
Francisco Santamaría
Publication year - 2017
Publication title -
revista uis ingenierías
Language(s) - Spanish
Resource type - Journals
eISSN - 2145-8456
pISSN - 1657-4583
DOI - 10.18273/revuin.v15n2-2016010
Subject(s) - reliability (semiconductor) , computer science , power quality , compatibility (geochemistry) , telecommunications , electrical engineering , reliability engineering , engineering , power (physics) , physics , quantum mechanics , voltage , chemical engineering
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom