Open AccessA Novel Testing Method for Interrupt Response Time
Author(s) -
Zhen Liu,
Yirong Shi,
Guanhua Zhang,
Bo Hu,
Fei Ye,
Hua Zhou
Publication year - 2021
Publication title -
proceedings of 2016 the 6th international workshop on computer science and engineering
Language(s) - English
Resource type - Conference proceedings
DOI - 10.18178/wcse.2021.06.025
Subject(s) - interrupt , computer science , reliability engineering , interrupt handler , embedded system , engineering , microcontroller
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