An Improved CAM for Weakly Supervised Fabric Defect Detection | Zendy

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An Improved CAM for Weakly Supervised Fabric Defect Detection

Publication year - 2020

Publication title -

proceedings of 2020 the 10th international workshop on computer science and engineering

Language(s) - English

Resource type - Conference proceedings

DOI - 10.18178/wcse.2020.06.020

Subject(s) - computer science , artificial intelligence , pattern recognition (psychology)

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