Open AccessModeling and Evaluation of Single Event Effects in 90nm MOS Devices
Author(s) -
Zhenhuan Wu,
Yuhe Li,
Zhendong Qiao,
Jiahua Kou,
Pengnian Yang
Publication year - 2017
Publication title -
proceedings of 2016 the 6th international workshop on computer science and engineering
Language(s) - English
Resource type - Conference proceedings
DOI - 10.18178/wcse.2017.06.179
Subject(s) - computer science , event (particle physics) , physics , quantum mechanics
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