Open AccessBootstrap Application for Semiconductor Incoming Material SPC
Author(s) -
Seungmo Kang,
Violet Shangguan,
Lisa Yu,
Wei-Ting Kary Chien
Publication year - 2015
Publication title -
international journal of materials, mechanics and manufacturing
Language(s) - Uncategorized
Resource type - Journals
ISSN - 1793-8198
DOI - 10.18178/ijmmm.2016.4.4.270
Subject(s) - statistical process control , process capability , semiconductor device fabrication , wafer , control chart , computer science , process engineering , reliability engineering , process control , process (computing) , statistics , engineering , work in process , mathematics , operations management , electrical engineering , operating system