Open AccessBootstrap Application for Semiconductor Incoming Material SPC
Author(s) -
Kang Sheng,
Violet Shangguan,
Lisa Yu,
Wei-Ting Kary Chien
Publication year - 2015
Publication title -
international journal of materials mechanics and manufacturing
Language(s) - Uncategorized
Resource type - Journals
ISSN - 1793-8198
DOI - 10.18178/ijmmm.2016.4.4.270
Subject(s) - statistical process control , process capability , semiconductor device fabrication , wafer , control chart , computer science , process engineering , reliability engineering , process control , process (computing) , statistics , engineering , work in process , mathematics , operations management , electrical engineering , operating system
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