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Two-Port SRAM Cell with Improved Write Operation
Author(s) -
Wen-Chieh Wu,
Ming-Chuen Shiau,
Chien-Cheng Yu,
Ching-Chih Tsai
Publication year - 2018
Publication title -
international journal of information and electronics engineering
Language(s) - English
Resource type - Journals
ISSN - 2010-3719
DOI - 10.18178/ijiee.2018.8.3.692
Subject(s) - port (circuit theory) , static random access memory , computer science , reliability engineering , engineering , computer hardware , electrical engineering

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