Open AccessFaults Detection in the Heatsinks Mounted on Power Electronic Transistors
Author(s) -
Matteo Vincenzo Quitadamo,
Davide Piumatti,
Matteo Sonza Reorda,
Franco Fiori
Publication year - 2020
Publication title -
international journal of electrical and electronic engineering and telecommunications
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.171
H-Index - 6
ISSN - 2319-2518
DOI - 10.18178/ijeetc.9.4.206-212
Subject(s) - transistor , electrical engineering , power (physics) , heat sink , power semiconductor device , computer science , reliability engineering , materials science , engineering , physics , voltage , quantum mechanics