Open AccessElectrical Characterization and Doping Uniformity Measurement during Crystalline Silicon Solar Cell Fabrication Using Hot Probe Method
Author(s) -
Nahid Akter,
Abul Hossion,
Mahbubul Hoq,
Sardar Masud Rana,
Md. Anzan-Uz-Zaman,
Md. Nasrul Haque Mia,
Md. Alamgir Kabir,
Zahid Mahmood
Publication year - 2014
Publication title -
engineering international
Language(s) - English
Resource type - Journals
ISSN - 2409-3629
DOI - 10.18034/ei.v2i1.206
Subject(s) - wafer , materials science , solar cell , optoelectronics , thermocouple , doping , crystalline silicon , common emitter , substrate (aquarium) , silicon , semiconductor , fabrication , composite material , medicine , oceanography , alternative medicine , pathology , geology