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BIPLOT ANALYSIS FOR SPOT BLOTCH AND YIELD TRAIT USING WAMI PANEL OF SPRING WHEAT
Author(s) -
Ram Narayan Ahirwar,
Vinod Kumar Mishra,
Dwijesh Chandra Mishra,
Neeraj Budhlakoti,
Shweta Singh,
Ramesh Chand
Publication year - 2020
Publication title -
journal of experimental biology and agricultural sciences
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.108
H-Index - 2
ISSN - 2320-8694
DOI - 10.18006/2020.8(2).115.124
Subject(s) - biplot , spring (device) , agronomy , yield (engineering) , trait , winter wheat , environmental science , biology , mathematics , engineering , computer science , materials science , genotype , biochemistry , gene , metallurgy , programming language , mechanical engineering

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