Open AccessSelection of the method for samples preparation for determination of properties of bimetal layers
Author(s) -
A. V Shumev,
V. D Draganyuk
Publication year - 2013
Publication title -
izvestiâ mgtu "mami"
Language(s) - English
Resource type - Journals
eISSN - 2949-1428
pISSN - 2074-0530
DOI - 10.17816/2074-0530-68032
Subject(s) - bimetal , selection (genetic algorithm) , layer (electronics) , materials science , zinc , thin layer , metallurgy , nanotechnology , computer science , machine learning
The article considers the ways to prepare samples with chemical removal of the zinc layer. This describes an indirect method of determining material properties of the thin layer in a multilayer metal.