Open AccessSynthesis, X-Ray Diffraction (XRD), Differential Thermal Analysis (DTA), and Scanning Electron Microscopy (SEM) of the Alloy (CuInTe2)1-x(NbTe)x with x=0.5
Author(s) -
Gerzón E. Delgado,
Miguel Palmera,
P. GrimaGallardo,
M. Quintero
Publication year - 2022
Publication title -
orbital
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.167
H-Index - 4
ISSN - 1984-6428
DOI - 10.17807/orbital.v14i1.1670
Subject(s) - scanning electron microscope , differential thermal analysis , crystallite , ingot , x ray crystallography , crystallography , powder diffraction , melting point , alloy , materials science , analytical chemistry (journal) , rietveld refinement , diffraction , crystal structure , chemistry , optics , metallurgy , composite material , physics , chromatography