Open AccessPROCEDIMENTO PARA A AVALIAÇÃO DA CONFORMIDADE METROLÓGICA DE ELETRONÍVEIS
Author(s) -
ERLAND GONZALEZ LEANO
Publication year - 2019
Language(s) - Portuguese
Resource type - Dissertations/theses
DOI - 10.17771/pucrio.acad.51459
Subject(s) - reliability (semiconductor) , metrology , calibration , reliability engineering , process (computing) , tilt (camera) , engineering , set (abstract data type) , computer science , mechanical engineering , statistics , physics , mathematics , power (physics) , quantum mechanics , programming language , operating system
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