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MICROSCOPIA DE FEIXE DUPLO COMO FERRAMENTA PARA MODIFICAÇÃO E CARACTERIZAÇÃO DE FILMES FINOS DE SEMICONDUTORES ORGÂNICOS E FABRICAÇÃO DE DISPOSITIVOS
Author(s) -
CRISTOL DE PAIVA GOUVEA
Publication year - 2017
Language(s) - Portuguese
Resource type - Dissertations/theses
DOI - 10.17771/pucrio.acad.29615
Subject(s) - physics

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