METROLOGICAL RELIABILITY OF TRANSCRANIAL MAGNETIC STIMULATION | Zendy

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METROLOGICAL RELIABILITY OF TRANSCRANIAL MAGNETIC STIMULATION

Author(s) -

IAM PALATNIK DE SOUSA

Publication year - 2016

Language(s) - Uncategorized

Resource type - Dissertations/theses

DOI - 10.17771/pucrio.acad.27524

Subject(s) - reliability (semiconductor) , transcranial magnetic stimulation , protocol (science) , reliability engineering , metrology , computer science , engineering , medical physics , systems engineering , risk analysis (engineering) , medicine , physics , psychology , statistics , mathematics , stimulation , neuroscience , power (physics) , quantum mechanics , alternative medicine , pathology

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