Open AccessReliability Sampling Procedure For High Priced Products
Author(s) -
V. Jemmy Joyce
Publication year - 2021
Publication title -
türk bilgisayar ve matematik eğitimi dergisi
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.218
H-Index - 3
ISSN - 1309-4653
DOI - 10.17762/turcomat.v12i4.609
Subject(s) - reliability (semiconductor) , sample size determination , sample (material) , computer science , sampling (signal processing) , reliability engineering , statistics , exponential distribution , function (biology) , exponential function , test plan , mathematics , weibull distribution , engineering , telecommunications , mathematical analysis , power (physics) , physics , chemistry , chromatography , quantum mechanics , evolutionary biology , detector , biology
Life testing for very high priced products with least of sample size can be done using the procedure of sampling plan designed in this paper. The required sample size for various of operating characteristic function using new design procedure is obtained using program in OCTAVE based on Lomaxdistribution and is compared with sample size obtained based on exponential distribution.