
STUDY OF THIN FILM STRUCTURES FOR USES IN ANEMOMETRY
Publication year - 2018
Publication title -
international journal of mechatronics and applied mechanics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.108
H-Index - 4
eISSN - 2559-4400
pISSN - 2559-4397
DOI - 10.17683/ijomam/issue4.28
Subject(s) - materials science , optics , physics