Open AccessDesign of a Cell Verification Module for Large-density EEPROM Memories
Author(s) -
Heon Park,
RiJun Jin,
Pan-Bong Ha,
Kim Young Hee
Publication year - 2017
Publication title -
han-gug jeongbo jeonja tongsin gisul haghoe nonmunji/han-guk jeongbo jeonja tongsin gisul hakoe nonmunji
Language(s) - English
Resource type - Journals
eISSN - 2288-9302
pISSN - 2005-081X
DOI - 10.17661/jkiiect.2017.10.2.176
Subject(s) - eeprom , computer science , embedded system , non volatile memory , computer hardware