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SEMIPARAMETRIC ESTIMATION OF STRESS STRENGTH RELIABILITY P[X > Y] OF LOMAX DISTRIBUTION
Author(s) -
Neethu Jacob,
E. S. Jeevanand
Publication year - 2021
Publication title -
far east journal of theoretical statistics
Language(s) - English
Resource type - Journals
ISSN - 0972-0863
DOI - 10.17654/ts061020095
Subject(s) - lomax distribution , reliability (semiconductor) , mathematics , estimation , stress (linguistics) , statistics , maximum likelihood , economics , physics , thermodynamics , philosophy , power (physics) , management , linguistics

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