
Resonance strength in Ne22(p,γ)Na23 from depth profiling in aluminum
Author(s) -
R. Longland,
C. Iliadis,
J.M. Cesaratto,
A.E. Champagne,
S. Daigle,
J.R. Newton,
R. Fitzgerald
Publication year - 2010
Publication title -
carolina digital repository (university of north carolina at chapel hill)
Language(s) - English
DOI - 10.17615/yzyq-3c06
Subject(s) - profiling (computer programming) , aluminium , geology , materials science , composite material , computer science , operating system