Open AccessReliability of mismatch negativity event-related potentials in a multisite, traveling subjects study
Author(s) -
B.J. Roach,
R.E. Carrión,
H.K. Hamilton,
P. Bachman,
A. Belger,
E. Duncan,
J. Johannesen,
G.A. Light,
M. Niznikiewicz,
J. Addington,
C.E. Bearden,
K.S. Cadenhead,
T.D. Can,
B.A. Cornblatt,
T.H. McGlashan,
D.O. Perkins,
L. Seidman,
M. Tsuang,
E.F. Walker,
S.W. Woods,
D.H. Mathalon
Publication year - 2020
Publication title -
carolina digital repository (university of north carolina at chapel hill)
Language(s) - English
DOI - 10.17615/speh-t208
Subject(s) - negativity effect , reliability (semiconductor) , event related potential , mismatch negativity , psychology , event (particle physics) , reliability engineering , cognitive psychology , statistics , electroencephalography , mathematics , neuroscience , engineering , physics , power (physics) , quantum mechanics