Reliability of an fMRI paradigm for emotional processing in a multisite longitudinal study
Author(s) -
Dylan G. Gee,
Sarah McEwen,
Jennifer K. Forsyth,
Kristen M. Haut,
Carrie E. Bearden,
Jean Addington,
Bradley G. Goodyear,
Kristin S. Cadenhead,
Heline Mirzakhanian,
Barbara A. Cornblatt,
Doreen M. Olvet,
Daniel H. Mathalon,
Thomas H. McGlashan,
Diana O. Perkins,
Ayşenil Belger,
Larry J. Seidman,
Heidi W. Thermenos,
Ming T. Tsuang,
Theo G.M. van Erp,
Elaine F. Walker,
Stephan Hamann,
Scott W. Woods,
R. Todd Constable,
Tyrone D. Can
Publication year - 2015
Publication title -
carolina digital repository (university of north carolina at chapel hill)
Language(s) - English
DOI - 10.17615/qnp3-vt24
Subject(s) - reliability (semiconductor) , psychology , cognitive psychology , longitudinal study , reliability engineering , engineering , medicine , power (physics) , physics , pathology , quantum mechanics
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