Open AccessThe Delta-Wye Approximation Procedure for Two-Terminal Reliability
Author(s) -
Manoj Chari,
Thomas A. Feo,
J. Scott Provan
Publication year - 1996
Publication title -
carolina digital repository (university of north carolina at chapel hill)
Language(s) - English
DOI - 10.17615/q227-3w63
Subject(s) - terminal (telecommunication) , reliability (semiconductor) , delta , reliability engineering , computer science , mathematics , physics , engineering , telecommunications , thermodynamics , power (physics) , astronomy