Open AccessAtomic force microscopy measurement of the Young’s modulus and hardness of single LaB6 nanowires
Author(s) -
Han Zhang,
Jie Tang,
Lin Zhang,
Bai An,
Lu Chang Qin
Publication year - 2008
Publication title -
carolina digital repository (university of north carolina at chapel hill)
Language(s) - English
DOI - 10.17615/p5f7-2982
Subject(s) - atomic force microscopy , nanowire , modulus , nanoindentation , materials science , microscopy , young's modulus , nanotechnology , composite material , crystallography , chemistry , optics , physics