Open AccessChaos-induced modulation of reliability boosts output firing rate in downstream cortical areas
Author(s) -
Paul Tiesinga
Publication year - 2004
Publication title -
carolina digital repository (university of north carolina at chapel hill)
Language(s) - English
DOI - 10.17615/jnde-r614
Subject(s) - modulation (music) , downstream (manufacturing) , chaos (operating system) , reliability (semiconductor) , physics , neuroscience , computer science , biology , engineering , acoustics , power (physics) , operations management , computer security , quantum mechanics