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Concordance and factor structure of subthreshold positive symptoms in youth at clinical high risk for psychosis
Author(s) -
M.E. Calkins,
S.W. Woods,
C.E. Bearden,
L. Liu,
T.M. Moore,
K.S. Cadenhead,
T.D. Can,
B.A. Cornblatt,
T.H. McGlashan,
D.O. Perkins,
L.J. Seidman,
M.T. Tsuang,
E.F. Walker,
D.H. Mathalon,
M. Keshavan,
W.S. Stone,
J. Addington
Publication year - 2021
Publication title -
carolina digital repository (university of north carolina at chapel hill)
Language(s) - English
DOI - 10.17615/htw4-rr63
Subject(s) - concordance , psychosis , subthreshold conduction , risk factor , psychology , clinical psychology , psychiatry , medicine , engineering , transistor , voltage , electrical engineering

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