Open AccessHigh accuracy FIONA–AFM hybrid imaging
Author(s) -
D.N. Fronczek,
C. Quammen,
H. Wang,
C. Kisker,
R. Superfine,
R. Taylor,
D.A. Erie,
I. Tessmer
Publication year - 2011
Publication title -
carolina digital repository (university of north carolina at chapel hill)
Language(s) - Uncategorized
DOI - 10.17615/dxh2-sw92
Subject(s) - atomic force microscopy , materials science , nanotechnology