
Reliability and bifurcation in neurons driven by multiple sinusoids
Author(s) -
P. John Thomas,
Paul Tiesinga,
Jean-Marc Fellous,
Terrence J. Sejnowski
Publication year - 2003
Publication title -
carolina digital repository (university of north carolina at chapel hill)
Language(s) - English
DOI - 10.17615/av96-9q96
Subject(s) - bifurcation , reliability (semiconductor) , computer science , physics , nonlinear system , thermodynamics , power (physics) , quantum mechanics