Reliability and bifurcation in neurons driven by multiple sinusoids
Author(s) -
Peter J. Thomas,
Paul Tiesinga,
JeanMarc Fellous,
Terrence J. Sejnowski
Publication year - 2003
Publication title -
carolina digital repository (university of north carolina at chapel hill)
Language(s) - English
DOI - 10.17615/av96-9q96
Subject(s) - bifurcation , reliability (semiconductor) , computer science , physics , nonlinear system , thermodynamics , power (physics) , quantum mechanics
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