Open AccessSimultaneous atomic force microscopy measurement of topography and contact resistance of metal films and carbon nanotubes
Author(s) -
Michael Stadermann,
Holger Grube,
John J. Boland,
S. J. Papadakis,
M. R. Falvo,
R. Superfine,
S. Washburn
Publication year - 2003
Publication title -
carolina digital repository (university of north carolina at chapel hill)
Language(s) - English
DOI - 10.17615/9thb-7d49
Subject(s) - atomic force microscopy , carbon nanotube , materials science , metal , nanotechnology , contact resistance , microscopy , kelvin probe force microscope , photoconductive atomic force microscopy , conductive atomic force microscopy , composite material , scanning capacitance microscopy , optics , metallurgy , scanning electron microscope , scanning confocal electron microscopy , physics , layer (electronics)