Open AccessMultisite reliability of MR-based functional connectivity
Author(s) -
Stephanie Noble,
Linda C. Mayes,
Emily S. Finn,
Xilin Shen,
Xenophon Papademetris,
Sarah McEwen,
Carrie Bearden,
Jean Addington,
Bradley G. Goodyear,
Kristin S. Cadenhead,
Heline Mirzakhanian,
Barbara A. Cornblatt,
Doreen M. Olvet,
Daniel H. Mathalon,
Thomas H. McGlashan,
Diana O. Perkins,
Ayşenil Belger,
Larry J. Seidman,
Heidi W. Thermenos,
Ming T. Tsuang,
Theo G.M. van Erp,
Elaine F. Walker,
Stephan Hamann,
Scott W. Woods,
Tyrone D. Can,
R. Todd Constable
Publication year - 2017
Publication title -
carolina digital repository (university of north carolina at chapel hill)
Language(s) - Uncategorized
DOI - 10.17615/9j5z-r435
Subject(s) - reliability (semiconductor) , functional connectivity , computer science , reliability engineering , psychology , neuroscience , physics , engineering , quantum mechanics , power (physics)