Multisite reliability of MR-based functional connectivity
Author(s) -
Stephanie Noble,
Dustin Scheinost,
Emily S. Finn,
Xilin Shen,
Xenophon Papademetris,
Sarah McEwen,
Carrie E. Bearden,
Jean Addington,
Bradley G. Goodyear,
Kristin S. Cadenhead,
Heline Mirzakhanian,
Barbara A. Cornblatt,
Doreen M. Olvet,
Daniel H. Mathalon,
Thomas H. McGlashan,
Diana O. Perkins,
Ayşenil Belger,
Larry J. Seidman,
Heidi W. Thermenos,
Ming T. Tsuang,
Theo G.M. van Erp,
Elaine F. Walker,
Stephan Hamann,
Scott W. Woods,
Tyrone D. Can,
R. Todd Constable
Publication year - 2017
Publication title -
carolina digital repository (university of north carolina at chapel hill)
Language(s) - Uncategorized
DOI - 10.17615/9j5z-r435
Subject(s) - reliability (semiconductor) , functional connectivity , computer science , reliability engineering , psychology , neuroscience , physics , engineering , quantum mechanics , power (physics)
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom