Open AccessInternational Classification of Reliability for Implanted Cochlear Implant Receiver Stimulators
Author(s) -
R. D. Battmer,
Douglas D. Backous,
Thomas J. Bałkany,
Robert Briggs,
Bruce J. Gantz,
Andrew van Hasselt,
Chong Sun Kim,
Takeshi Kubo,
Thomas Lenarz,
Harold C. Pillsbury,
Gerard M. O’Donoghue
Publication year - 2010
Publication title -
carolina digital repository (university of north carolina at chapel hill)
Language(s) - English
DOI - 10.17615/7mvh-rq88
Subject(s) - cochlear implant , reliability (semiconductor) , audiology , implant , cochlear implantation , computer science , speech recognition , medicine , surgery , physics , quantum mechanics , power (physics)