International Classification of Reliability for Implanted Cochlear Implant Receiver Stimulators
Author(s) -
Andrew van Hasselt,
Douglas D. Backous,
Rolf D. Battmer,
Chong Sun Kim,
Harold C. Pillsbury,
Takeshi Kubo,
Bruce J. Gantz,
Gerard M. O’Donoghue,
Robert Briggs,
Thomas Lenarz,
Thomas J. Bałkany
Publication year - 2020
Publication title -
unc libraries
Language(s) - English
DOI - 10.17615/7mvh-rq88
Subject(s) - cochlear implant , reliability (semiconductor) , audiology , implant , cochlear implantation , computer science , speech recognition , medicine , surgery , physics , quantum mechanics , power (physics)
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