Test-retest and between-site reliability in a multicenter fMRI study
Author(s) -
Lee S. Friedman,
Hal S. Stern,
Gregory G. Brown,
Daniel H. Mathalon,
Jessica A. Turner,
Gary H. Glover,
Randy L. Gollub,
John Lauriello,
Kelvin O. Lim,
Tyrone D. Can,
Douglas N. Greve,
H. Jeremy Bockholt,
Ayşenil Belger,
Bryon A. Mueller,
Michael J. Doty,
Jianchun He,
William A. Wells,
Padhraic Smyth,
Steve Pieper,
Seyoung Kim,
Marek Kubicki,
Márk Vangel,
Steven G. Potkin
Publication year - 2008
Publication title -
carolina digital repository (university of north carolina at chapel hill)
Language(s) - English
DOI - 10.17615/73h8-rx33
Subject(s) - reliability (semiconductor) , test (biology) , psychology , multicenter study , computer science , reliability engineering , medicine , engineering , biology , randomized controlled trial , power (physics) , physics , quantum mechanics , paleontology
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