Open AccessCross-paradigm connectivity: reliability, stability, and utility
Author(s) -
H. Cao,
Oscar Chen,
S.C. McEwen,
J.K. Forsyth,
D.G. Gee,
C.E. Bearden,
J. Addington,
B. Goodyear,
K.S. Cadenhead,
H. Mirzakhanian,
B.A. Cornblatt,
R.E. Carrión,
D.H. Mathalon,
T.H. McGlashan,
D.O. Perkins,
A. Belger,
H. Thermenos,
M.T. Tsuang,
T.G.M. van Erp,
E.F. Walker,
S. Hamann,
A. Anticevic,
S.W. Woods,
T.D. Can
Publication year - 2021
Publication title -
carolina digital repository (university of north carolina at chapel hill)
Language(s) - English
DOI - 10.17615/5wbn-wr70
Subject(s) - reliability (semiconductor) , stability (learning theory) , reliability engineering , computer science , engineering , machine learning , physics , power (physics) , quantum mechanics