Open AccessInfrared rotating-analyzer ellipsometry: calibration and data processing
Author(s) -
V. A. Yakovlev,
M. Li,
E. A. Irene
Publication year - 1993
Publication title -
carolina digital repository (university of north carolina at chapel hill)
Language(s) - Uncategorized
DOI - 10.17615/43mr-9v98
Subject(s) - spectrum analyzer , calibration , ellipsometry , infrared , materials science , optics , remote sensing , physics , nanotechnology , geology , thin film , quantum mechanics