
Parametric Analysis of External Noise Regression for Reliability Optimization in Transformers
Author(s) -
Mahendra P. Singh,
Asha Chauhan,
Avtar Nadir
Publication year - 2015
Publication title -
international journal of engineering research and technology
Language(s) - English
Resource type - Journals
ISSN - 2278-0181
DOI - 10.17577/ijertv4is050391
Subject(s) - parametric statistics , transformer , computer science , reliability (semiconductor) , reliability engineering , regression analysis , engineering , mathematics , electrical engineering , statistics , physics , machine learning , voltage , power (physics) , quantum mechanics