Open AccessCircular economy of ITO thin films deposited on glass obtained from degraded OLED devices
Author(s) -
Emerson Roberto Santos,
Lucas Henrique Silva de Jesus,
Elvo Calixto Burini,
Roberto Koji Onmori,
Shu Hui Wang
Publication year - 2021
Publication title -
revista brasileira de aplicações de vácuo
Language(s) - English
Resource type - Journals
eISSN - 1983-4047
pISSN - 0101-7659
DOI - 10.17563/rbav.v40i1.1209
Subject(s) - oled , materials science , chromaticity , indium tin oxide , thin film , raman spectroscopy , pedot:pss , optoelectronics , sheet resistance , substrate (aquarium) , layer (electronics) , light emitting diode , electroluminescence , optics , nanotechnology , oceanography , physics , geology
In this work, circular economy was investigated for commercial indium tin oxide (ITO) thin films deposited on glass substrates obtained from degraded organic light-emitting diodes (OLED). These devices were assembled and polarized at laboratory in a previous work. For each substrate, with geometry 2.5 × 2.5 cm, four OLEDs with active area of 3 × 3 mm were set up. These OLED devices were assembled with ITO as the electrode anode and successive depositions of other materials (layer-by-layer), to form the complete structure. To obtain the recovered ITO, all layers were removed from the samples containing the OLEDs previously mounted, remaining only the ITO thin films, that were cleaned with commercial product together with the received ITO/glass samples. Both samples were compared using some techniques, such as: colorimetry, electrical resistance, and Raman spectroscopy. A methodology with light-emitting diode (LED) device polarized emitting light crossing the ITO thin films was used, and the luminance with chromaticity coordinates was obtained, revealing the good transparency of the thin films. Electrical resistance of recovered ITO revealed five higher orders of magnitude in comparison to the one of received ITO. This fact can be tributed to a poly(3,4-ethylenedioxythiophene) doped with poly(styrenesulfonate) (PEDOT:PSS) layer, causing corrosion of the ITO thin films during the assembly of OLEDs or loss of the field lines created during the electrical measurements by probes of four-point probe. Raman spectroscopy did not show satisfactory results in the chemical composition analyses of the samples, but it indicated good cleaning process of the samples before the analyses.