Open AccessAccelerated degradation analysis based on a random-effect Wiener process with one-order autoregressive errors
Author(s) -
Junxing Li,
Zhihua Wang,
Chengrui Liu,
Ming Qiu
Publication year - 2019
Publication title -
eksploatacja i niezawodność
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.47
H-Index - 27
eISSN - 2956-3860
pISSN - 1507-2711
DOI - 10.17531/ein.2019.2.8
Subject(s) - autoregressive model , wiener process , autocorrelation , reliability (semiconductor) , randomness , computer science , statistical inference , degradation (telecommunications) , process (computing) , econometrics , inference , statistics , mathematics , artificial intelligence , telecommunications , power (physics) , physics , quantum mechanics , operating system