Open AccessA Weibull failure model to the study of the hierarchical Bayesian reliability
Author(s) -
Tiefeng Zhu,
Zaizai Yan,
Xiuyun Peng
Publication year - 2016
Publication title -
eksploatacja i niezawodność
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.47
H-Index - 27
eISSN - 2956-3860
pISSN - 1507-2711
DOI - 10.17531/ein.2016.4.4
Subject(s) - weibull distribution , reliability engineering , reliability (semiconductor) , bayesian probability , bayesian hierarchical modeling , hierarchical database model , computer science , statistics , bayesian inference , engineering , mathematics , data mining , physics , power (physics) , quantum mechanics