Open AccessAn E-Bayesian method for reliability analysis of exponentially distributed products with zero-failure data
Author(s) -
Yi-Chao Yin,
HongZhong Huang,
Weiwen Peng,
Yanfeng Li,
Jinhua Mi
Publication year - 2016
Publication title -
eksploatacja i niezawodność
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.47
H-Index - 27
eISSN - 2956-3860
pISSN - 1507-2711
DOI - 10.17531/ein.2016.3.17
Subject(s) - zero (linguistics) , bayesian probability , reliability (semiconductor) , exponential distribution , computer science , exponential growth , statistics , reliability engineering , mathematics , engineering , physics , mathematical analysis , philosophy , thermodynamics , linguistics , power (physics)