Open AccessA novel Wiener process model with measurement errors for degradation analysis
Author(s) -
Zhihua Wang,
Junxing Li,
Yongbo Zhang,
Huimin Fu,
Chengrui Liu,
Sridhar Krishnaswamy
Publication year - 2016
Publication title -
eksploatacja i niezawodność
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.47
H-Index - 27
eISSN - 2956-3860
pISSN - 1507-2711
DOI - 10.17531/ein.2016.3.11
Subject(s) - degradation (telecommunications) , wiener process , process (computing) , computer science , environmental science , statistics , mathematics , telecommunications , programming language