
The Accuracy of the Contact Method of Measuring the Current Area of the Crystals Grown by the Czochralski Method
Author(s) -
Sergey P. Sahansky
Publication year - 2016
Publication title -
žurnal sibirskogo federalʹnogo universiteta. tehnika i tehnologii/žurnal sibirskogo federalʹnogo universiteta. seriâ: tehnika i tehnologii
Language(s) - English
Resource type - Journals
eISSN - 2313-6057
pISSN - 1999-494X
DOI - 10.17516/1999-494x-2016-9-8-1279-1290
Subject(s) - czochralski method , materials science , current (fluid) , optoelectronics , analytical chemistry (journal) , chemistry , electrical engineering , chromatography , engineering , silicon