Open AccessEconomic-statistical Design of Synthetic X Chart for Monitoring Process Mean under Non-normality
Author(s) -
Pheng Hak Tan,
Ming Ha Lee,
M. L. Dennis Wong
Publication year - 2017
Publication title -
indian journal of science and technology
Language(s) - English
Resource type - Journals
eISSN - 0974-6846
pISSN - 0974-5645
DOI - 10.17485/ijst/2018/v11i45/138545
Subject(s) - chart , normality , statistics , computer science , \bar x and r chart , sensitivity (control systems) , control chart , normal distribution , process (computing) , mathematics , control limits , engineering , electronic engineering , operating system