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Fault Classification in Mixed Signal Circuits using Artificial Neural Networks
Author(s) -
R. Aravindhan,
S. Vanila,
Vaibhav Sharma
Publication year - 2016
Publication title -
indian journal of science and technology
Language(s) - English
Resource type - Journals
eISSN - 0974-6846
pISSN - 0974-5645
DOI - 10.17485/ijst/2016/v9i38/101931
Subject(s) - artificial neural network , computer science , electronic circuit , signal (programming language) , fault (geology) , parametric statistics , artificial intelligence , analogue electronics , stuck at fault , mixed signal integrated circuit , fault detection and isolation , algorithm , electronic engineering , integrated circuit , engineering , electrical engineering , mathematics , statistics , seismology , geology , actuator , programming language , operating system

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